Pulsed laser deposition of skutterudite thin films

Citation
Jc. Caylor et al., Pulsed laser deposition of skutterudite thin films, J APPL PHYS, 89(6), 2001, pp. 3508-3513
Citations number
34
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
6
Year of publication
2001
Pages
3508 - 3513
Database
ISI
SICI code
0021-8979(20010315)89:6<3508:PLDOST>2.0.ZU;2-D
Abstract
Skutterudite (CoSb3 and IrSb3) thin films of high phase purity and crystall inity have been prepared by pulsed laser deposition. It is found that while the crystallinity of the films increases with increasing temperature, the phase purity decreases due to antimony volatility. The skutterudite phase c an be stabilized to higher temperature by addition of excess antimony to th e pulsed laser deposition target. Target-to-substrate distance must be opti mized to obtain stoichiometric skutterudite films with low stress. A decrea se in the flux of energetic particles and changes in particle stoichiometry with increasing distance caused by plume tilting results in lower film str ess, but the diantimonide phase is nucleated if the distance is too large. It is possible to further reduce compressive stress by growing films in an inert background gas to decrease the flux of energetic particles. Overall, the highest quality films are grown from targets with excess antimony at a temperature of 270 degreesC with a target-to-substrate distance of 7 cm and a background argon gas pressure of 10 mTorr. The resistivity, mobility, an d carrier concentration of these films are indicative of a degenerate p-typ e semiconductor with hole concentrations in the range of previously measure d bulk values. (C) 2001 American Institute of Physics.