We report a detailed study of the dependence of the vibrational modes in ra
pid thermal chemical vapor deposition grown Si1-x-yGexCy samples on substit
utional carbon concentration. The difficulty in incorporating substitutiona
l carbon in these alloys with concentrations higher than a few tenths of an
atomic percent is well known. We show that simultaneous analysis of x-ray
diffraction, infrared absorption, and Raman scattering measurements can be
used to determine the fraction of substitutional carbon from the total carb
on content. We claim that the uncertainty in defining this fraction led to
the discrepancies between the interpretations of previous studies. The freq
uency shifts of the C local modes and the Si-Si mode are studied, in additi
on to the intensity dependence of the former. The evolution of C satellite
peaks and their dependence on total C concentration are presented. There is
a large frequency change of these modes, indicating a very large local bon
d distortion induced by the presence of carbon in the lattice. We show that
the shifts of the Si-Si mode frequencies due to the Ge and C content are n
ot simply the addition of each contribution separately. The rate at which t
hey shift with changing C concentration depends on the Ge content in the al
loy. The probability of creating ordered substitutional C-C pairs, rather t
han randomly distributed C atoms in the crystal lattice, increases nonlinea
rly as a function of the carbon content. (C) 2001 American Institute of Phy
sics.