Short-range order and strain in SiGeC alloys probed by phonons

Citation
E. Finkman et al., Short-range order and strain in SiGeC alloys probed by phonons, J APPL PHYS, 89(5), 2001, pp. 2580-2587
Citations number
34
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
5
Year of publication
2001
Pages
2580 - 2587
Database
ISI
SICI code
0021-8979(20010301)89:5<2580:SOASIS>2.0.ZU;2-2
Abstract
We report a detailed study of the dependence of the vibrational modes in ra pid thermal chemical vapor deposition grown Si1-x-yGexCy samples on substit utional carbon concentration. The difficulty in incorporating substitutiona l carbon in these alloys with concentrations higher than a few tenths of an atomic percent is well known. We show that simultaneous analysis of x-ray diffraction, infrared absorption, and Raman scattering measurements can be used to determine the fraction of substitutional carbon from the total carb on content. We claim that the uncertainty in defining this fraction led to the discrepancies between the interpretations of previous studies. The freq uency shifts of the C local modes and the Si-Si mode are studied, in additi on to the intensity dependence of the former. The evolution of C satellite peaks and their dependence on total C concentration are presented. There is a large frequency change of these modes, indicating a very large local bon d distortion induced by the presence of carbon in the lattice. We show that the shifts of the Si-Si mode frequencies due to the Ge and C content are n ot simply the addition of each contribution separately. The rate at which t hey shift with changing C concentration depends on the Ge content in the al loy. The probability of creating ordered substitutional C-C pairs, rather t han randomly distributed C atoms in the crystal lattice, increases nonlinea rly as a function of the carbon content. (C) 2001 American Institute of Phy sics.