Structural and vibrational properties of molecular beam epitaxy grown cubic (Al, Ga)N/GaN heterostructures

Citation
T. Frey et al., Structural and vibrational properties of molecular beam epitaxy grown cubic (Al, Ga)N/GaN heterostructures, J APPL PHYS, 89(5), 2001, pp. 2631-2634
Citations number
23
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
5
Year of publication
2001
Pages
2631 - 2634
Database
ISI
SICI code
0021-8979(20010301)89:5<2631:SAVPOM>2.0.ZU;2-K
Abstract
The radio-frequency plasma-assisted molecular beam epitaxy of cubic AlyGa1- yN/GaN heterostructures on GaAs(001) substrates is reported. Rutherford bac kscattering spectroscopy, high resolution x-ray diffraction, and first-orde r micro-Raman spectroscopy measurements were used to characterize the struc tural and vibrational properties of the alloy epilayers. The Al content of the alloy is in the range from 0.07 <x <0.20. X-ray diffraction reciprocal space maps demonstrate the good crystal quality of the cubic (Al, Ga)N/GaN films. The measured Raman shift of the TO phonon mode of the AlyGa1-yN allo y is in good agreement with theoretical calculations. (C) 2001 American Ins titute of Physics.