Theoretical substantiation of methods for measuring impedances of one-ports and S-parameters of two-ports

Authors
Balyko, AK Gusel'nikov, NA Pchelin, VA Yusupova, NI
Citation
Ak. Balyko et al., Theoretical substantiation of methods for measuring impedances of one-ports and S-parameters of two-ports, J COMMUN T, 46(2), 2001, pp. 232-235
Citations number
5
Categorie Soggetti
Information Tecnology & Communication Systems
Journal title
JOURNAL OF COMMUNICATIONS TECHNOLOGY AND ELECTRONICS
ISSN journal
10642269 → ACNP
Volume
46
Issue
2
Year of publication
2001
Pages
232 - 235
Database
ISI
SICI code
1064-2269(200102)46:2<232:TSOMFM>2.0.ZU;2-G
Abstract
A method for the determination of the input admittance of a two-port tone-p ort) from measured moduli of the reflection and transmission coefficients i s proposed for two versions of the measurement circuit. The results of meas uring the characteristics of a 3P608B transistor in the 14.5-15.5 GHz frequ ency band are presented. A method for determining the S-parameters from the measured moduli of the reflection and transmission coefficients is theoret ically substantiated.