Components in electronic packaging structures are of different dimensions a
nd are made of dissimilar materials that typically have time, temperature,
and direction-dependent thermo-mechanical properties. Due to the complexity
in geometry, material behavior, and thermal loading patterns, finite-eleme
nt analysis (FEA) is often used to study the thermo-mechanical behavior of
electronic packaging structures. For computational reasons, researchers oft
en use two-dimensional (2D) models instead of three-dimensional (3D) models
. Although 2D models are computationally efficient, they could provide misl
eading results, particularly under thermal loading. The focus of this paper
is to compare the results from various 2D, 3D, and generalized plane-defor
mation strip models and recommend a suitable modeling procedure. Particular
emphasis is placed to understand how the third-direction coefficient of th
ermal expansion (CTE) influences the warpage and the stress results predict
ed by 2D models under thermal loading. It is seen that the generalized plan
e-deformation strip models are the best compromise between the 2D and 3D mo
dels. Suitable analytical formulations have also been developed to corrobor
ate the findings from the study.