This paper introduces the concept of a process capability matrix - an order
ed set of dimensionless parameters that capture information on a manufactur
ing system's response to disturbances. The matrix is similar to the process
capability indices C-p and C-pk, but is extended to multiple acceptence cr
iteria and multiple causes of variation. Equations are presented that use t
he matrix to estimate yield in manufacture of products with multiple accept
ance criteria. The surface mount of large body electronic packages serves a
s an example of the effectiveness of the process capability matrix as a too
l for design decision making. [S1087-1357(00)0160-4].