Modeling illumination-mode near-field optical microscopy of Au nanoparticles

Citation
As. Liu et al., Modeling illumination-mode near-field optical microscopy of Au nanoparticles, J OPT SOC A, 18(3), 2001, pp. 704-716
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION
ISSN journal
10847529 → ACNP
Volume
18
Issue
3
Year of publication
2001
Pages
704 - 716
Database
ISI
SICI code
1084-7529(200103)18:3<704:MINOMO>2.0.ZU;2-A
Abstract
We present a theoretical analysis of near-held scanning optical microscopy (NSOM) images of small Au particles made in the illumination mode. We model the metal-coated fiber tip as a thin disk consisting of a glass core and a n aluminum coating. An external held locally illuminates the tip core. We s olve for the local fields, including interactions between the tip and the A u particles, by use of the coupled dipole method and calculate the optical signal collected in the far field. We also determine the tip field, in the absence of the particle, for various tip sizes with different metal-coating thicknesses. Calculated tip fields and simulated images are compared with those obtained with the Bethe-Bouwkamp model, a commonly used simple model for the tip held. Calculated line scans of the NSOM images of Au particles depend strongly on the tip aperture size and metal-coating thickness. For b lunt tips with a thick metal coating and sharp tips with a much thinner coa ting, our thin-disk model reproduces the key features of measured NSOM imag es. Line scans calculated with the Bethe-Bouwkamp model cannot describe the tip dependence of the experimental images. Tip fields obtained from the th in-disk model show significant enhancement beneath the metal coating and a broader field distribution perpendicular to the polarization. Tip fields ob tained with the Bethe-Bouwkamp model do not show these effects. Differences in the line scans for these two models are correlated to the differences b etween the tip fields for the two models. These differences occur because o nly the disk model accounts for a finite metal coating. (C) 2001 Optical So ciety of America.