Si interband tunnel diodes have been successfully fabricated by molecular b
eam epitaxy and room temperature peak-to-valley current ratios of 1.7 have
been achieved. The diodes consist of opposing n- and p-type delta -doped in
jectors separated by an intrinsic Si spacer. A ''p-on-n'' configuration was
achieved for the first time using a novel low temperature growth technique
that exploits the strong surface segregation behavior of Sb, the n-type do
pant, to produce sharp delta-doped profiles adjacent to the intrinsic Si sp
acer. (C) 2001 American Vacuum Society.