"p-on-n" Si interband tunnel diode grown by molecular beam epitaxy

Citation
Kd. Hobart et al., "p-on-n" Si interband tunnel diode grown by molecular beam epitaxy, J VAC SCI B, 19(1), 2001, pp. 290-293
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
19
Issue
1
Year of publication
2001
Pages
290 - 293
Database
ISI
SICI code
1071-1023(200101/02)19:1<290:"SITDG>2.0.ZU;2-L
Abstract
Si interband tunnel diodes have been successfully fabricated by molecular b eam epitaxy and room temperature peak-to-valley current ratios of 1.7 have been achieved. The diodes consist of opposing n- and p-type delta -doped in jectors separated by an intrinsic Si spacer. A ''p-on-n'' configuration was achieved for the first time using a novel low temperature growth technique that exploits the strong surface segregation behavior of Sb, the n-type do pant, to produce sharp delta-doped profiles adjacent to the intrinsic Si sp acer. (C) 2001 American Vacuum Society.