Second-harmonic generation spectroscopy: A technique for selectively probing excitons - art. no. 085111

Citation
Am. Janner et al., Second-harmonic generation spectroscopy: A technique for selectively probing excitons - art. no. 085111, PHYS REV B, 6308(8), 2001, pp. 5111
Citations number
38
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
6308
Issue
8
Year of publication
2001
Database
ISI
SICI code
0163-1829(20010215)6308:8<5111:SGSATF>2.0.ZU;2-C
Abstract
We show that second-harmonic generation (SHG) and sum-frequency generation (SFG) are selective tools for probing excitons. In SHG and SFG measurements performed on C-60 and CuCl films we observe Frenkel and Wannier excitons, respectively. On the other hand, no second-harmonic (sum-frequency) intensi ty enhancement was observed at energies above the conductivity gap. This is in strong contrast to, for instance, one-photon and two-photon absorption experiments. The selectivity of SHG and SFG for excitons compared to interb and transitions can be explained in terms of coherence of the respective ex citation processes.