Wj. Zhang et S. Matsumoto, Investigations of crystallinity and residual stress of cubic boron nitridefilms by Raman spectroscopy - art. no. 073201, PHYS REV B, 6307(7), 2001, pp. 3201
With a spatial correlation model, a simple method was established to evalua
te the crystallinity and stress of cubic boron nitride (cBN) films from the
variation of linewidth and peak shift of Raman spectra. An increase of cry
stallinity and a decrease of stress of the cBN films with growth time were
demonstrated. As a reference, the Raman spectra of cBN single crystals synt
hesized by a high-pressure, high-temperature method were also investigated.
Our cBN film deposited for 1 h revealed a low stress of about 1 GPa and a
comparable crystallinity to that of 4-8 mum commercially available cBN sing
le crystals.