Real-time imaging of atomistic process in one-atom-thick metal junctions -art. no. 073405

We present an in situ and time resolved high-resolution transmission electr on microscopy study of the atomistic process during the last elongation sta ges of gold nanojunctions. In particular, we concentrate on suspended chain s of atoms, which have shown to be remarkably stable, although they present rather long bonds (3.0-3.6 Angstrom). One-atom-thick junctions are robust, but their attachment points move rather easily on the metal surface, allow ing the accommodation of apex movements or rotations.