Dw. Palmer et al., Characterization of electroluminescent structures based on gallium arsenide ion-implanted with ytterbium and oxygen, SEMICONDUCT, 35(3), 2001, pp. 325-330
Light-emitting diodes based on GaAs crystals ion-implanted with ytterbium a
nd oxygen were fabricated. The current-voltage and capacitance-voltage char
acteristics of these diodes were analyzed. The deep-level centers were stud
ied by the deep-level transient spectroscopy. The electroluminescence spect
ra of the structures include the emission lines related to optical transiti
ons within the 4f shell of Yb3+ ions. (C) 2001 MAIK "Nauka/Interperiodica".