Dl. Peng et al., Co cluster coalescence behavior observed by electrical conduction and transmission electron microscopy, APPL PHYS L, 78(11), 2001, pp. 1535-1537
We deposited monodispersed Co clusters with mean diameters d = 6, 8.5, and
13 nm on quartz and microgrid substrates using a plasma-gas-condensation-ty
pe cluster beam deposition system. The cluster-cluster coalescence behavior
of the Co cluster assemblies was investigated by in situ electrical conduc
tivity measurements and ex situ transmission electron microscopy (TEM). The
electrical conductivity measurement indicates that, below temperature T ap
proximate to 100 degreesC, the Co clusters with d=8.5 nm maintain their ori
ginal size as deposited at room temperature, while the cluster-cluster coal
escence takes place at their interface at T > 100 degreesC. The TEM observa
tion indicates that the morphology of the cluster distribution shows no mar
ked change at substrate temperatures T-s < 250 degreesC. Above T-s = 300 de
greesC, the interfacial area of coalesced clusters is crystalline, and has
its own orientation, different from that of two connected cluster cores. (C
) 2001 American Institute of Physics.