DATA PREPARATION FOR QUANTITATIVE HIGH-RESOLUTION ELECTRON-MICROSCOPY

A method is described to prepare a high-resolution electron micrograph for quantitative comparison with a simulated high-resolution image. T he experimental data are converted from the darkening of film used to acquire the image to units of electrons per incident electron, the sam e units used in the simulation. Also, distortions in the image arising from distortions in the image-forming lenses of the electron microsco pe are removed to improve the quality of the data. Finally, an alignme nt procedure is described which gives precise, pixel-by-pixel alignmen t of the experimental image with the simulated image. Examples of the procedure are shown to illustrate how actual data are prepared for qua ntitative analysis.