We have fabricated a SOI laterally diffused MOSFET that is designed for use
in radio frequency power amplifiers for wireless system-on-a-chip applicat
ions. The device is fabricated on a thin-him SOI wafer using a process that
is suitable for integration with SOI CMOS, An under-source body contact is
implemented and both a high breakdown voltage and a high f(t) are attained
. The device performance compares favorably with bulk silicon rf power MOSF
ETs. For a gate length of 0.7 mum the device f(t) is 14 GHz, f(max) is 18 G
Hz, and the breakdown voltage approaches 25 V.