Charge sharing, which occurs in any complementary metal-oxide-semiconductor
(CMOS) domino gate, may degrade the output voltage level or may even cause
an erroneous output value. In this paper, this problem is thoroughly inves
tigated by considering:circuit topology and circuit function. We describe a
method to measure the sensitivity [called charge-sharing (CS) vulnerabilit
y] of the CS problem for each domino gate. A method to derive the CS vulner
ability and the test vector for each domino gate is suggested. We also prop
ose a transistor reordering method to dramatically reduce the CS vulnerabil
ities for all domino gates so that the CS problem can be alleviated. We als
o prove theoretically: that a set of test vectors generated for single char
ge-sharing faults (SCSFs) can also detect all multiple charge-sharing fault
s (MCSFs), This good property significantly guarantees the test quality for
the CS faults of domino circuits.