Polysilicon quantization effects on the electrical properties of MOS transistors (vol 47, pg 2266, 2000.)

Citation
As. Spinelli et al., Polysilicon quantization effects on the electrical properties of MOS transistors (vol 47, pg 2266, 2000.), IEEE DEVICE, 48(3), 2001, pp. 609-609
Citations number
1
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
ISSN journal
00189383 → ACNP
Volume
48
Issue
3
Year of publication
2001
Pages
609 - 609
Database
ISI
SICI code
0018-9383(200103)48:3<609:PQEOTE>2.0.ZU;2-4