Decoherence in a single trapped ion due to an engineered reservoir

Authors
Yi, XX Zhou, DL Sun, CP
Citation
Xx. Yi et al., Decoherence in a single trapped ion due to an engineered reservoir, J OPT B-QUA, 3(1), 2001, pp. 1-5
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF OPTICS B-QUANTUM AND SEMICLASSICAL OPTICS
ISSN journal
14644266 → ACNP
Volume
3
Issue
1
Year of publication
2001
Pages
1 - 5
Database
ISI
SICI code
1464-4266(200102)3:1<1:DIASTI>2.0.ZU;2-5
Abstract
The decoherence in a trapped ion induced by coupling the ion to the enginee red reservoir is studied in this paper. The engineered reservoir is simulat ed by random variations in the trap frequency, and the trapped ion is treat ed as a two-level system driven by a far-off-resonant plane wave laser fiel d. The dependence of the decoherence rate on the amplitude of the superposi tion state is given.