Three-dimensional analysis of the local structure of Cu on TiO2(110) by insitu polarization-dependent total-reflection fluorescence XAFS

Cu K-edge XAFS of Cu/TiO2(110) was measured by polarization-dependent total -reflection fluorescence XAFS technique. XAFS of [001], [1(1) over bar 0], and [110] directions were measured to elucidate the three dimensional struc ture of Cu species on the TiO2(110) surface prepared by the deposition of C u(DPM)(2) followed by reduction with H-2. Simulation of the EXAFS functions as well as conventional curve fitting analysis revealed that plane Cu3-4 s mall clusters with similar structure to Cu(111) plane were formed by the re duction at 363 K. The small clusters converted into spherical metallic Cu p articles by the reduction at 473 K.