Site-selective XAFS spectroscopy tuned to surface active sites of Cu/ZnO and Cr/SiO2 catalysts

Citation
Y. Izumi et al., Site-selective XAFS spectroscopy tuned to surface active sites of Cu/ZnO and Cr/SiO2 catalysts, J SYNCHROTR, 8, 2001, pp. 605-607
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF SYNCHROTRON RADIATION
ISSN journal
09090495 → ACNP
Volume
8
Year of publication
2001
Part
2
Pages
605 - 607
Database
ISI
SICI code
0909-0495(200103)8:<605:SXSTTS>2.0.ZU;2-D
Abstract
XAFS (X-ray absorption fine structure) spectra were measured by using the f luorescence spectrometer for the emitted X-ray from sample. The chemical sh ifts between Cu-0 and Cu-I and between Cr-III and Cr-VI were evaluated. Tun ing the fluorescence spectrometer to each energy, the Cu-0 and Cu-I site-se lective XANES for Cu/ZnO catalyst were measured. The first one was similar to the XANES of Cu metal and the second one was the 5 : 5 average of XANES for Cu-I sites + Cu metal. The population ratio of copper site of the Cu/Zn O catalyst was found to be Cu metal : Cu2O : Cu-I atomically dispersed on s urface = 70(+/-23) : 22(+/-14) : 8(+/-5). Site-selective XANES for Cr-III s ite of Cr/SiO2 catalyst was also studied.