Simultaneous measurement of XANES in halide-intercalated BSCCO(2212) usingelectron and fluorescence yield to compare their performance

Total Yield with an escape depth of similar to 100-200 Angstrom is known to be rather surface sensitive. Fluorescence Yield, on the other hand, with a n escape depth of similar to 1000-2000 Angstrom is relatively less prone to surface effects but necessitates some corrections to obtain the true signa l. Both have their plus and minus points and, if used with care, yield reli able data. In the present experiment both the techniques have been simultan eously employed for measuring orientation dependent O K and the Cu L-3 edge s from an uncleaved surface of I(2)BSCCO(2212) single crystal to compare th e performance of the two modes of detection. Despite glaring differences in intensities the results from the two appear to show reasonable agreement i n respect of relative intensities of the spectral features.