Efficient march test for 3-coupling faults in random access memories

A new efficient march test algorithm for detecting the 3-coupling faults in Random Access Memories (RAM) is given in this paper. To reduce the length of the test algorithm only the 3-coupling faults between physically adjacen t memory cells have been considered. The proposed test algorithm needs 38N operations. We have proved, using an Eulerian graph model, that the algorit hm detects all non-interacting coupling faults. This paper also comprises a study about the ability of the algorithm to cover the interacting coupling faults. Simulation results with regard to the coupling fault coverage of the march tests, obtained based on a fault injection mechanism, are also presented in this paper. (C) 2001 Elsevier Science B.V. All rights reserved.