Intensity optimisation of a high-resolution ToF diffractometer

Citation
F. Demmel et al., Intensity optimisation of a high-resolution ToF diffractometer, NUCL INST A, 459(1-2), 2001, pp. 265-272
Citations number
16
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT
ISSN journal
01689002 → ACNP
Volume
459
Issue
1-2
Year of publication
2001
Pages
265 - 272
Database
ISI
SICI code
0168-9002(20010221)459:1-2<265:IOOAHT>2.0.ZU;2-4
Abstract
The analytical optimisation of a proposed high-resolution time-of-flight di ffractometer in back scattering geometry will be shown. To obtain this aim we have formulated the resolution and the intensity in simple geometric par ameters. The optimised configuration can be found analytically under the co ndition of a given resolution by the Lagrange multiplicator method. The equ ations for resolution and intensity have been compared with Monte Carlo sim ulation results. (C) 2001 Elsevier Science B.V. All rights reserved.