Picosecond x-ray diffraction probed transient structural changes in organic solids

Citation
S. Techert et al., Picosecond x-ray diffraction probed transient structural changes in organic solids, PHYS REV L, 86(10), 2001, pp. 2030-2033
Citations number
26
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
86
Issue
10
Year of publication
2001
Pages
2030 - 2033
Database
ISI
SICI code
0031-9007(20010305)86:10<2030:PXDPTS>2.0.ZU;2-U
Abstract
In this Letter, we report on the experimental characterization of the geome try of short-lived electronically excited states in organic solids by time- resolved x-ray diffraction. Here, the structure factor of the organic cryst al is measured as a function of time. Since this technique gives complete s tructural information, it is a very useful tool for learning more about ato m motions on the excited-state energy surface-"beyond" the broad band typic al of conventional spectroscopy. Although we used molecular crystals rather than free molecules, the compounds show detectable transient structural ch anges on the ps to ns time scale in our study.