Plasma curvature effects on microwave reflectometry fluctuation measurements

Citation
Y. Lin et al., Plasma curvature effects on microwave reflectometry fluctuation measurements, PLASMA PHYS, 43(1), 2001, pp. L1-L8
Citations number
14
Categorie Soggetti
Physics
Journal title
PLASMA PHYSICS AND CONTROLLED FUSION
ISSN journal
07413335 → ACNP
Volume
43
Issue
1
Year of publication
2001
Pages
L1 - L8
Database
ISI
SICI code
0741-3335(200101)43:1<L1:PCEOMR>2.0.ZU;2-8
Abstract
Plasma poloidal curvature can significantly extend microwave reflectometry responses to high k(perpendicular to) poloidal fluctuations. Reflectometry responses can be several orders of magnitude larger at high k(perpendicular to) than that predicted by analysis based on two dimensional (2-D) slab ge ometry. As a result, the responses may approach the 1-D geometrical optics limit. This superresolution leads to a major modification of the spectral r esolution of reflectometry. The phenomenon is analysed using a phase screen model for the general cases and the results are supported by detailed nume rical 2-D realistic geometry full wave simulations for the specific case of the Alcator C-Mod tokamak.