Stability of an ultra-thin Fe film on a Cu(100) surface studied by positron-annihilation induced Auger electron spectroscopy (PAES)

Citation
Jh. Kim et al., Stability of an ultra-thin Fe film on a Cu(100) surface studied by positron-annihilation induced Auger electron spectroscopy (PAES), APPL SURF S, 173(3-4), 2001, pp. 203-207
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
173
Issue
3-4
Year of publication
2001
Pages
203 - 207
Database
ISI
SICI code
0169-4332(20010329)173:3-4<203:SOAUFF>2.0.ZU;2-V
Abstract
The stability and intermixing of ultra-thin Fe layers grown on a Cu(1 0 0) surface has been studied as a function of film thickness, growth temperatur e and annealing history using positron-annihilation induced Auger electron spectroscopy (PAES). Theoretical calculations and previous experimental PAE S studies indicate that when a complete metal layer is formed on top of a m etal substrate almost of all the PAES signal originates from the overlayer. However, in the research reported here, it was found that even after depos itions in excess of I equivalent monolayer (eq. ML) of Fe at 173 K and 3 eq . ML at 303 K, a significant fraction of the Cu PAES signal was observed. T hese result are consistent with the formation of Fe islands leaving regions of exposed Cu surface or with Cu mixing with or moving on top of the depos ited Fe. The increase in the fraction of Cu in the top most layer observed as the sample was heated is consistent with a thermally induced increase in island height or an increase in the diffusion of Cu into or on top of the surface layer. (C) 2001 EIsevier Science B.V. All rights reserved.