The estimation of the average dimensions of deposited clusters from XPS emission intensity ratios

Citation
Dq. Yang et al., The estimation of the average dimensions of deposited clusters from XPS emission intensity ratios, APPL SURF S, 173(1-2), 2001, pp. 134-139
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
173
Issue
1-2
Year of publication
2001
Pages
134 - 139
Database
ISI
SICI code
0169-4332(20010322)173:1-2<134:TEOTAD>2.0.ZU;2-P
Abstract
We propose a method for the calculation of the average size of spherical cl usters on a surface, using XPS emission intensity ratios. The method is app lied to the case of Cu clusters on Dow Cyclotene 3022. a low permittivity p olymer. It gives reasonable particle sizes and number densities, and shows that the clusters coalesce on annealing. TEM photomicrographs confirm the s ize and sphericity of the clusters formed. (C) 2001 Published by Elsevier S cience B.V.