A method of spatial resolution determination of X-ray films is describ
ed. The technique is based on the use of a mask with a pattern of rand
omly distributed transmitting and nontransmitting areas. Images on X-r
ay materials were obtained with the use of synchrotron radiation from
the S-60 (FIAN) synchrotron. It is suggested that X-ray images can be
processed by the linear filter technique, The results of test measurem
ents using RAR2490 and Kodak 10106 X-ray films are presented and compa
red with data obtained by other methods.