A technique for the thermogravimetric analysis of samples placed in a
high-power microwave radiation field is described, To measure and regu
late temperature, the laser interferometry method for measuring the op
tical thickness of a plate-applicator was used, providing an accuracy
of at least 2 degrees C in a range from 20 to 1000 degrees C. Weighing
was performed with conventional instruments to an accuracy of up to 0
.1 mg.