Tight-binding (TB) potentials allow for a straightforward separation of the
binding and repulsive contributions in the total energy. This issue can be
used in molecular dynamics runs to correlate the local atomic structure to
the diffusion paths and the activation energies of silicon mobility in TiS
i2, which is the most common material for metallisations and local intercon
nects in microelectronic devices. In this work we focus on the self-diffusi
on process at high temperature and a relation between the crystal structure
s and the diffusion paths for the two competing phases is drawn. (C) 2001 E
lsevier Science B.V. All rights reserved.