Self-diffusion of silicon in TiSi2 competing phases by tight-binding molecular dynamics

Citation
M. Iannuzzi et al., Self-diffusion of silicon in TiSi2 competing phases by tight-binding molecular dynamics, COMP MAT SC, 20(3-4), 2001, pp. 394-400
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
COMPUTATIONAL MATERIALS SCIENCE
ISSN journal
09270256 → ACNP
Volume
20
Issue
3-4
Year of publication
2001
Pages
394 - 400
Database
ISI
SICI code
0927-0256(200103)20:3-4<394:SOSITC>2.0.ZU;2-K
Abstract
Tight-binding (TB) potentials allow for a straightforward separation of the binding and repulsive contributions in the total energy. This issue can be used in molecular dynamics runs to correlate the local atomic structure to the diffusion paths and the activation energies of silicon mobility in TiS i2, which is the most common material for metallisations and local intercon nects in microelectronic devices. In this work we focus on the self-diffusi on process at high temperature and a relation between the crystal structure s and the diffusion paths for the two competing phases is drawn. (C) 2001 E lsevier Science B.V. All rights reserved.