AFM force curve meaurements have been performed on layers of entangled mult
iwall carbon nanotubes, produced by chemical vapor deposition, to measure t
he nanotubes adhesive and elastic properties. AFM tip radius and nanotube d
iameter being comparable, these layers are a discrete medium for the force
curve measurements. Controlling the tip-layer interaction, we can specifica
lly probe the response of one or several nanotubes. If the tip is strongly
pressed against the layer, it interacts with several nanotubes; for a weak
interaction, it interacts with only one nano-object. Non-linear behavior in
force curves is an evidence for an inelastic response of the nanotubes. Nu
merical simulations of the layer-AFM tip system mechanical analysis reprodu
ce all the nanotubes adhesion and mechanical experimental features.