Tin in float glass: A diffusion-reaction model based on surface analysis explains the tin hump

Citation
G. Heide et al., Tin in float glass: A diffusion-reaction model based on surface analysis explains the tin hump, GL SCI T-GL, 73, 2000, pp. 321-330
Citations number
15
Categorie Soggetti
Material Science & Engineering
Journal title
GLASS SCIENCE AND TECHNOLOGY-GLASTECHNISCHE BERICHTE
ISSN journal
09467475 → ACNP
Volume
73
Year of publication
2000
Supplement
C2
Pages
321 - 330
Database
ISI
SICI code
0946-7475(2000)73:<321:TIFGAD>2.0.ZU;2-T
Abstract
The aim of this work was the characterization of commercial float glasses i n view of their interaction with the tin bath melt in the float chamber. De pth profile analyses were performed both in the nanometer and the micromete r ranges using secondary neutral mass spectrometry, Rutherford backscatteri ng spectrometry and electron probe microanalysis. Conversion electron Mossb auer spectrometry was applied to describe the ratio of Sn2+ and Sn4+ as a f unction of penetration depth. From the depth profiles obtained in the nanom eter and micrometer ranges, effective diffusion coefficients could be calcu lated for both regimes. Based on these results a qualitative diffusion-reac tion model was developed which allows the interpretation of the tin anomaly found in several of the glasses.