NV-SRAM: A nonvolatile SRAM with backup ferroelectric capacitors

Citation
T. Miwa et al., NV-SRAM: A nonvolatile SRAM with backup ferroelectric capacitors, IEEE J SOLI, 36(3), 2001, pp. 522-527
Citations number
10
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE JOURNAL OF SOLID-STATE CIRCUITS
ISSN journal
00189200 → ACNP
Volume
36
Issue
3
Year of publication
2001
Pages
522 - 527
Database
ISI
SICI code
0018-9200(200103)36:3<522:NANSWB>2.0.ZU;2-0
Abstract
This paper demonstrates new circuit technologies that enable a 0.25-mum ASI C SRAM macro to be nonvolatile with only a 17% cell-area overhead. New capa citor-on-metal/via-stacked-plug process technologies permit a nonvolatile S RAM (NV-SRAM) cell to consist of a six-transistor ASIC SRAM cell and two ba ckup ferroelectric capacitors stacked over the SRAM portion. READ and WRITE operations in this NV-SRAM cell are very similar to those of a standard SR AM, and this NV-SRAM shares almost all the circuit properties of a standard SRAM. Because each memory cell can perform STORE and RECALL individually, both can execute massive-parallel operations. A V-dd/2 plate-line architect ure makes READ/WRITE fatigue negligible. A 512-byte test chip was successfu lly fabricated to show compatibility with ASIC technologies.