This paper demonstrates new circuit technologies that enable a 0.25-mum ASI
C SRAM macro to be nonvolatile with only a 17% cell-area overhead. New capa
citor-on-metal/via-stacked-plug process technologies permit a nonvolatile S
RAM (NV-SRAM) cell to consist of a six-transistor ASIC SRAM cell and two ba
ckup ferroelectric capacitors stacked over the SRAM portion. READ and WRITE
operations in this NV-SRAM cell are very similar to those of a standard SR
AM, and this NV-SRAM shares almost all the circuit properties of a standard
SRAM. Because each memory cell can perform STORE and RECALL individually,
both can execute massive-parallel operations. A V-dd/2 plate-line architect
ure makes READ/WRITE fatigue negligible. A 512-byte test chip was successfu
lly fabricated to show compatibility with ASIC technologies.