We have written bits in longitudinal media at extremely high areal densitie
s, >100, using a focused ion beam (FIB) trimmed write head mounted on a sta
tic write/read tester. Bits were written at a track pitch of similar to 100
nm and with a 62.5 transition spacing with the same trimmed write head. Th
e bits were characterized with the head read sensor and also with magnetic
force microscopy (MFM). The MFM images were analyzed with respect to transi
tion position jitter, signal-to-noise, and track width.