Modeling of misfit induced defects in Co/Cr recording media

A 2D model to study the effect of crystal orientation on interfacial struct ural misfit and Co grain defect density for hcp Co/bcc Cr thin him system h as been introduced. The magnitude of misfit depends strongly on the Co/Cr o rientation, their respective lattice parameters, the grain size and to a Le sser extend, the relative lattice orientation across the interface. However , the modeling results showed that by introducing lattice defects such as f ee stacking faults and misfit dislocations in the Co layer, one can greatly reduce this misfit and relax the interface.