Effect of seedlayer and junction geometry on permanent magnet stabilization of magnetoresistive heads

Citation
N. Sharma et al., Effect of seedlayer and junction geometry on permanent magnet stabilization of magnetoresistive heads, IEEE MAGNET, 36(5), 2000, pp. 2496-2498
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON MAGNETICS
ISSN journal
00189464 → ACNP
Volume
36
Issue
5
Year of publication
2000
Part
1
Pages
2496 - 2498
Database
ISI
SICI code
0018-9464(200009)36:5<2496:EOSAJG>2.0.ZU;2-4
Abstract
The dependence of CoPt stabilization properties on surface topography and s eedlayer thickness has been investigated. The Coercivity degrades drastical ly without a Cr seed, showing a dependence upon surface angle. Using the re sulting data wafer level sensor structures are micromagnetic simulated, Poo r seedlayer coverage on the junction edge yields open transfer curve loops and degraded sensor response.