Effect of seedlayer and junction geometry on permanent magnet stabilization of magnetoresistive heads

The dependence of CoPt stabilization properties on surface topography and s eedlayer thickness has been investigated. The Coercivity degrades drastical ly without a Cr seed, showing a dependence upon surface angle. Using the re sulting data wafer level sensor structures are micromagnetic simulated, Poo r seedlayer coverage on the junction edge yields open transfer curve loops and degraded sensor response.