Low-resistance tunnel magnetoresistive head

Citation
K. Ohashi et al., Low-resistance tunnel magnetoresistive head, IEEE MAGNET, 36(5), 2000, pp. 2549-2553
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON MAGNETICS
ISSN journal
00189464 → ACNP
Volume
36
Issue
5
Year of publication
2000
Part
1
Pages
2549 - 2553
Database
ISI
SICI code
0018-9464(200009)36:5<2549:LTMH>2.0.ZU;2-8
Abstract
A tunnel magnetoresistive (TMR) head with a low resistance of about 30 Omeg a and effective track width of 1.4 mum was fabricated using an in situ natu ral oxidation (ISNO) technique. Its read-output was almost the same as that expected from test elements at the wafer level. We found no large differen ce in noise voltages between TMR head and GMR head when their resistance wa s about 30 Omega. A very low-resistivity TMR element with a resistance-area product of 14 Omega . mum(2) and a fairly high DeltaR/R of 14% was also de veloped using ISNO, A signal-to-noise ratio consideration suggests that suc h low resistance is a key to TMR heads for high recording densities.