Characterization of cobalt nanowires by means of force microscopy

Citation
Jm. Garcia et al., Characterization of cobalt nanowires by means of force microscopy, IEEE MAGNET, 36(5), 2000, pp. 2981-2983
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON MAGNETICS
ISSN journal
00189464 → ACNP
Volume
36
Issue
5
Year of publication
2000
Part
1
Pages
2981 - 2983
Database
ISI
SICI code
0018-9464(200009)36:5<2981:COCNBM>2.0.ZU;2-D
Abstract
In this paper, an experimental study on both the electrolytic growth and th e magnetic properties of cobalt nanowires is presented, The wires were elec trodeposited into the pores of track-etched polymer membranes, having a dia meter ranging from 80 up to 250 nm depending on the size of the pores. The filling of the pores was monitored combining the measurement of the electro lytic current-time curves with Atomic Forte Microscopy imaging (AFM), After dissolving the membranes, the magnetic domain structure of isolated nanowi res was visualized by means of Magnetic Force Microscopy (MFM) showing a mu ltidomain pattern, The results are analyzed considering that the c axis of the hcp-Co crystallites is mainly perpendicular to the wire axis.