Study of in-depth defects using magneto-optical Kerr Effect by measuring the magnetic hardness coefficient in magnetic thin films

A Magneto-optical Kerr Effect (MOKE) system was built and used for acquirin g saturation magnetization curves and measuring the magnetic hardness coeff icient, a of magnetic thin film samples. Co thin films were sputtered on gl ass substrate under various sputtering conditions. The magnetic hardness co efficient was measured using the MOKE setup. Results for a (Oe) were furthe r correlated using transmission electron microscopy (TEM) and X-ray diffrac tion (XRD) analysis. It was found that a (Oe), a useful indicator for in-de pth defects in Co films, increased with both working and base pressure but decreased with higher deposition temperatures. This trend is in agreement w ith well-known microstructure control techniques by changing sputtering par ameters.