Effect of low-temperature diffusion annealing on the properties of PbSnTeIn epilayers

Citation
Lf. Vasil'Eva et al., Effect of low-temperature diffusion annealing on the properties of PbSnTeIn epilayers, INORG MATER, 37(2), 2001, pp. 144-148
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
INORGANIC MATERIALS
ISSN journal
00201685 → ACNP
Volume
37
Issue
2
Year of publication
2001
Pages
144 - 148
Database
ISI
SICI code
0020-1685(200102)37:2<144:EOLDAO>2.0.ZU;2-A
Abstract
A procedure was proposed for low-temperature vapor-phase In doping of Pb1-x SnxTe films grown by molecular-beam epitaxy on BaF2 substrates. Diffusion a nnealing was call icd out in a hydrogen atmosphere in the presence of a vap or source identical in composition to the film and a dopant source at tempe ratures which were, in most cases, no higher than the growth temperature (3 00-460 degreesC). The effect of diffusion annealing on the composition, tra nsport properties, and homogeneity of both undoped and In doped films was e xamined. The results suggest that indium is transported in the vapor phase in the form of indium tellurides resulting from the reaction between Te vap or and liquid In.