Fine grinding of silicon wafers

Citation
Zj. Pei et A. Strasbaugh, Fine grinding of silicon wafers, INT J MACH, 41(5), 2001, pp. 659-672
Citations number
16
Categorie Soggetti
Mechanical Engineering
Journal title
INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE
ISSN journal
08906955 → ACNP
Volume
41
Issue
5
Year of publication
2001
Pages
659 - 672
Database
ISI
SICI code
0890-6955(200104)41:5<659:FGOSW>2.0.ZU;2-3
Abstract
Silicon wafers are used for the production of most microchips. Various proc esses are needed to transfer a silicon crystal ingot into wafers. As one of such processes, surface grinding of silicon wafers has attracted attention among various investigators and a limited number of articles can be found in the literature. However, no published articles are available regarding f ine grinding of silicon wafers. In this paper, the uniqueness and the speci al requirements of the silicon wafer fine grinding process are introduced f irst. Then some experimental results on the fine grinding of silicon wafers are presented and discussed. Tests on different grinding wheels demonstrat e the importance of choosing the correct wheel and an illustration of the p roper selection of process parameters is included. Also discussed are the e ffects of the nozzle position and the flow rate of the grinding coolant. (C ) 2001 Elsevier Science Ltd. All rights reserved.