Atomic Force Microscope techniques for adhesion measurements

Authors
Schaefer, DM Gomez, J
Citation
Dm. Schaefer et J. Gomez, Atomic Force Microscope techniques for adhesion measurements, J ADHESION, 74(1-4), 2000, pp. 341
Citations number
30
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF ADHESION
ISSN journal
00218464 → ACNP
Volume
74
Issue
1-4
Year of publication
2000
Database
ISI
SICI code
0021-8464(2000)74:1-4<341:AFMTFA>2.0.ZU;2-F
Abstract
The Atomic Force Microscope (AFM) has become a powerful apparatus for perfo rming real-time, quantitative force measurements between materials. Recentl y the AFM has been used to measure adhesive interactions between probes pla ced on the AFM cantilever and sample surfaces. This article reviews progres s in this area of adhesion measurement, and describes a new technique (Jump Mode) for obtaining adhesion maps of surfaces. Jump mode has the advantage of producing fast. quantitative adhesion maps with minimal memory usage.