Distributed gain measurements in Er-doped fibers with high resolution and accuracy using an optical frequency domain reflectometer

Citation
M. Wegmuller et al., Distributed gain measurements in Er-doped fibers with high resolution and accuracy using an optical frequency domain reflectometer, J LIGHTW T, 18(12), 2000, pp. 2127-2132
Citations number
10
Categorie Soggetti
Optics & Acoustics
Journal title
JOURNAL OF LIGHTWAVE TECHNOLOGY
ISSN journal
07338724 → ACNP
Volume
18
Issue
12
Year of publication
2000
Pages
2127 - 2132
Database
ISI
SICI code
0733-8724(200012)18:12<2127:DGMIEF>2.0.ZU;2-5
Abstract
For critical Erbium-doped fiber amplifier (EDFA) design, e.g., gain tilt op timization in WDM booster amplifiers, knowledge of the gain distribution wi thin the active fiber can present a valuable information. Among the differe nt techniques to evaluate the distributed gain in active fibers, the techni que of optical frequency domain reflectometry seems most promising as it is a nondestructive measurement method well matched to the task due to its dy namic range, resolution, and range, Moreover, background light from ASE or residual pump light is strongly rejected due to the coherent detection sche me employed. Using different Erbium-doped fibers with strongly varying dopi ng levels and confinements, we demonstrate the excellent accuracy and repro ducibility of the technique.