A study of Raman spectroscopy and low-temperature specific heat in gel-synthesized amorphous silica

Citation
A. Bartolotta et al., A study of Raman spectroscopy and low-temperature specific heat in gel-synthesized amorphous silica, J NON-CRYST, 280(1-3), 2001, pp. 249-254
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF NON-CRYSTALLINE SOLIDS
ISSN journal
00223093 → ACNP
Volume
280
Issue
1-3
Year of publication
2001
Pages
249 - 254
Database
ISI
SICI code
0022-3093(200102)280:1-3<249:ASORSA>2.0.ZU;2-I
Abstract
A comparative study of low-temperature specific heat (1.5-25 K), C-p, and l ow-frequency Raman scattering (< 150 cm(-1)) has been performed in amorphou s silica samples synthesized by sol-gel method (xerogels) and thermally den sified in a range of densities, from rho = 1250 kg m(-3) to rho = 2100 kg m (-3), close to the density of the melt quenched vitreous silica (v-SiO2). T he present analysis concerns the application of the low-energy vibrational dynamics as an appropriate tool for monitoring the progressive thermal dens ification of silica gels. By comparison with v-SiO2, the Raman and thermal properties of xerogels with increasing thermal treatment temperature reveal ed the following important results: (i) the existence of a critical treatme nt temperature at about 870 degreesC, where a homogeneous viscous sintering produces full densification of the samples. This effect is detected by the observations of the Boson peak in Raman spectra at about 45 cm(-1) and of a peak in C-p(T)T (3), very close to those observed in v-SiO2; (ii) in sili ca xerogels treated at temperatures less than about 800 degreesC, the low-f requency Raman scattering is greater, with a continuous decreasing unstruct ured shape, and the Boson peak is not detected in the spectra. (C) 2001 Els evier Science B.V. All rights reserved.