Monte Carlo simulation of kinetic electron emission induced by MeV He+ andHe++ ions incident on polycrystalline aluminium

Citation
A. Dubus et al., Monte Carlo simulation of kinetic electron emission induced by MeV He+ andHe++ ions incident on polycrystalline aluminium, MATH COMP S, 55(1-3), 2001, pp. 37-48
Citations number
39
Categorie Soggetti
Engineering Mathematics
Journal title
MATHEMATICS AND COMPUTERS IN SIMULATION
ISSN journal
03784754 → ACNP
Volume
55
Issue
1-3
Year of publication
2001
Pages
37 - 48
Database
ISI
SICI code
0378-4754(20010215)55:1-3<37:MCSOKE>2.0.ZU;2-1
Abstract
A theoretical study of the characteristics of kinetic electron emission ind uced by He+ and He++ ions (in the MeV-range) incident on polycrystalline al uminium targets is presented in this paper. The models of interactions for the incident projectiles as well as for the excited electrons are described . Especially, the electron excitation induced by incident Het is calculated by taking into account the structure of the composite projectile. Charge e xchange processes by the projectiles are also considered. The subsequent el ectron transport and escape is calculated by means of a Monte Carlo simulat ion code. The calculated electron emission yield is compared to experimenta l results. The differences between He+ and He++ are discussed, the role of the electron lost by He+ being especially emphasised. (C) 2001 IMACS. Publi shed by Elsevier Science B.V. All rights reserved.