Shl. Seah et al., Effective modeling of temperature-dependent body current for submicron devices under Bi-MOS hybrid-mode operation, MICROELEC J, 32(3), 2001, pp. 205-214
In a Bipolar/MOS hybrid-mode environment, lateral p-n-p BJT in an active pM
OS structure is employed for its high current gain and simple technology. I
n these designs, the presence of positive source-body voltage (V-SB) causes
the body current characteristics to deviate from that predicted by models
in existing literature. In this paper, a new body current model suitable fo
r hybrid-mode devices is developed. Temperature dependence of the body curr
ent in the range from 223 to 398 K has also been modeled. In addition, the
effects of temperature and positive V-SB on parameters such as threshold vo
ltage, effective channel length, external series resistance and saturation
drain voltage, have also been discussed in the model. A multitude of experi
mental data has been presented to demonstrate the validity of the proposed
model for a wide range of biases. temperatures and channel lengths. (C) 200
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