Ultrahigh vacuum scanning probe microscopy studies of carbon onions

Authors
Hou, SM Tao, CG Zhang, GM Zhao, XY Xue, ZQ Shi, ZJ Gu, ZN
Citation
Sm. Hou et al., Ultrahigh vacuum scanning probe microscopy studies of carbon onions, PHYSICA E, 9(2), 2001, pp. 300-304
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA E
ISSN journal
13869477 → ACNP
Volume
9
Issue
2
Year of publication
2001
Pages
300 - 304
Database
ISI
SICI code
1386-9477(200102)9:2<300:UVSPMS>2.0.ZU;2-Y
Abstract
Carbon onions were prepared by DC are charge method. The behavior and elect ronic propel ties of carbon onions on highly oriented pyrolytic graphite (H OPG) substrate were studied by ultrahigh vacuum atomic force microscopy and scanning tunneling microscopy (UHV AFM/STM). UHV AFM/STM images showed tha t these ellipsoidal carbon onions tended to aggregate into clusters on the surface of HOPG. The scanning tunneling spectroscopy indicated that the ele ctrical properties of carbon onions were between graphite and single-shell fullerenes. (C) 2001 Elsevier Science B.V. All rights reserved.