Optical and structural properties of self-organized InGaAsN/GaAs nanostructures

Citation
Bv. Volovik et al., Optical and structural properties of self-organized InGaAsN/GaAs nanostructures, SEMIC SCI T, 16(3), 2001, pp. 186-190
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
ISSN journal
02681242 → ACNP
Volume
16
Issue
3
Year of publication
2001
Pages
186 - 190
Database
ISI
SICI code
0268-1242(200103)16:3<186:OASPOS>2.0.ZU;2-L
Abstract
Structural and optical properties of thin InGaAsN insertions in GaAs, grown by molecular beam epitaxy using an RF nitrogen plasma source, have been in vestigated. Nitrogen incorporation into InGaAs results in a remarkable broa dening of the luminescence spectrum as compared with that of InGaAs layer w ith the same indium content. Correspondingly, a pronounced corrugation of t he upper interface and the formation of well defined nanodomains are reveal ed in cross-sectional and plan-view transmission electron microscope (TEM) images, respectively. Raising the indium concentration in InGaAsN (N < 1 %) to 35 % results in the formation of well defined separated three-dimension al (3D) islands. The size of the nanodomains proves that the InGaAsN insert ions in GaAs should be regarded as quantum dot structures even in the case of relatively small indium concentrations (25 %) and layer thicknesses (7 n m), which are below the values required for a 2D-3D transition to occur in InGaAs/GaAs growth. Dislocation loops have been found in TEM images of the structures emitting at 1.3 <mu>m. They are expected to be responsible for t he degradation of the luminescence intensity of such structures in agreemen t with the case of long-wavelength InGaAs-GaAs quantum dots.