In this report, a method which can significantly increase the measurement r
ate of the light-addressable potentiometric sensor (LAPS) is suggested. By
illuminating the LAPS simultaneously at several positions, of which each is
illuminated with a light pointer modulated with a different frequency, the
surface potential at all illuminated regions can be measured simultaneousl
y by analysing the resulting photocurrent. By:using this method, the rate t
o obtain a complete image of the surface potential distribution across a LA
PS wafer can be drastically increased compared to the conventional mode, il
l which images are obtained by scanning the surface with one single light p
ointer. The technical feasibility of such a device is discussed and test me
asurements an presented. (C) 2001 Elsevier Science B.V. All rights reserved
.