Tests of fit for the laplace distribution, with applications

Citation
P. Puig et Ma. Stephens, Tests of fit for the laplace distribution, with applications, TECHNOMET, 42(4), 2000, pp. 417-424
Citations number
23
Categorie Soggetti
Mathematics
Journal title
TECHNOMETRICS
ISSN journal
00401706 → ACNP
Volume
42
Issue
4
Year of publication
2000
Pages
417 - 424
Database
ISI
SICI code
0040-1706(200011)42:4<417:TOFFTL>2.0.ZU;2-D
Abstract
Tests are given for the Laplace or double exponential distribution. The tes t statistics are based on the empirical distribution function and include t he families of Cramer-von Mises and Kolmogorov-Smirnov. Asymptotic theory i s given, and asymptotic points are calculated, for the Cramer-von Mises fam ily, and Monte Carlo points for, finite samples are given for all the stati stics. Power studies suggest that the Watson statistic is the most powerful for the common problem of testing Laplace against other symmetric distribu tions. An application of the Laplace distribution is in LAD (or L-1) regres sion. This is also discussed in the article, with two examples.